RADIOGRAPHIC INSPECTION METHOD, RADIOGRAPHIC INSPECTION APPARATUS, RADIOGRAPHIC INSPECTION SYSTEM, AND RADIOGRAPHIC INSPECTION PROGRAM
A radiographic inspection apparatus acquires a first image and a second image; receives an input of selection of a region of interest in a region corresponding to an article in the first image or the second image; specifies respective first pixel values of a plurality of first pixels and respective...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A radiographic inspection apparatus acquires a first image and a second image; receives an input of selection of a region of interest in a region corresponding to an article in the first image or the second image; specifies respective first pixel values of a plurality of first pixels and respective second pixel values of a plurality of second pixels corresponding to the plurality of first pixels, and calculates a thickness correction function by approximating a relationship between the first pixel values and the second pixel values corresponding to the first pixel values; calculates a plurality of pieces of representative data each of which is a combination of a first representative value and a second representative value on the basis of the respective first pixel values of the plurality of first pixels and the respective second pixel values of the plurality of second pixels corresponding to the plurality of first pixels; and calculates an evaluation coefficient based on a correlation between the thickness correction function and the plurality of pieces of calculated representative data. |
---|