IMAGING SYSTEMS AND METHODS OF OPERATING THE SAME
Disclosed herein is a method, comprising: for i=1, . . . , N, exposing a pixel (i) of a same radiation detector to a radiation (i) thereby causing an apparent signal (i) in the pixel (i), wherein the pixel (i) is at a temperature (i) at the time the pixel (i) is exposed to the radiation (i); for i=1...
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creator | CAO, Peiyan |
description | Disclosed herein is a method, comprising: for i=1, . . . , N, exposing a pixel (i) of a same radiation detector to a radiation (i) thereby causing an apparent signal (i) in the pixel (i), wherein the pixel (i) is at a temperature (i) at the time the pixel (i) is exposed to the radiation (i); for i=1, . . . , N, determining the temperature (i) of the pixel (i); and for i=1, . . . , N, determining an actual value (i) of a same radiation characteristic of the radiation (i) based on the apparent signal (i) and the temperature (i), wherein N is a positive integer. The radiation characteristic may be radiation intensity, radiation phase, or radiation polarization. |
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The radiation characteristic may be radiation intensity, radiation phase, or radiation polarization.</description><language>eng ; fre ; ger</language><subject>ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; PHYSICS ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230104&DB=EPODOC&CC=EP&NR=4111681A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230104&DB=EPODOC&CC=EP&NR=4111681A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CAO, Peiyan</creatorcontrib><title>IMAGING SYSTEMS AND METHODS OF OPERATING THE SAME</title><description>Disclosed herein is a method, comprising: for i=1, . . . , N, exposing a pixel (i) of a same radiation detector to a radiation (i) thereby causing an apparent signal (i) in the pixel (i), wherein the pixel (i) is at a temperature (i) at the time the pixel (i) is exposed to the radiation (i); for i=1, . . . , N, determining the temperature (i) of the pixel (i); and for i=1, . . . , N, determining an actual value (i) of a same radiation characteristic of the radiation (i) based on the apparent signal (i) and the temperature (i), wherein N is a positive integer. The radiation characteristic may be radiation intensity, radiation phase, or radiation polarization.</description><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD09HV09_RzVwiODA5x9Q1WcPRzUfB1DfHwdwlW8HdT8A9wDXIMASkI8XBVCHb0deVhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuASaGhoZmFoaOhsZEKAEA9kwl7A</recordid><startdate>20230104</startdate><enddate>20230104</enddate><creator>CAO, Peiyan</creator><scope>EVB</scope></search><sort><creationdate>20230104</creationdate><title>IMAGING SYSTEMS AND METHODS OF OPERATING THE SAME</title><author>CAO, Peiyan</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4111681A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2023</creationdate><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CAO, Peiyan</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CAO, Peiyan</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IMAGING SYSTEMS AND METHODS OF OPERATING THE SAME</title><date>2023-01-04</date><risdate>2023</risdate><abstract>Disclosed herein is a method, comprising: for i=1, . . . , N, exposing a pixel (i) of a same radiation detector to a radiation (i) thereby causing an apparent signal (i) in the pixel (i), wherein the pixel (i) is at a temperature (i) at the time the pixel (i) is exposed to the radiation (i); for i=1, . . . , N, determining the temperature (i) of the pixel (i); and for i=1, . . . , N, determining an actual value (i) of a same radiation characteristic of the radiation (i) based on the apparent signal (i) and the temperature (i), wherein N is a positive integer. The radiation characteristic may be radiation intensity, radiation phase, or radiation polarization.</abstract><oa>free_for_read</oa></addata></record> |
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language | eng ; fre ; ger |
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subjects | ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING |
title | IMAGING SYSTEMS AND METHODS OF OPERATING THE SAME |
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