IMAGING SYSTEMS AND METHODS OF OPERATING THE SAME

Disclosed herein is a method, comprising: for i=1, . . . , N, exposing a pixel (i) of a same radiation detector to a radiation (i) thereby causing an apparent signal (i) in the pixel (i), wherein the pixel (i) is at a temperature (i) at the time the pixel (i) is exposed to the radiation (i); for i=1...

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Bibliographische Detailangaben
1. Verfasser: CAO, Peiyan
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:Disclosed herein is a method, comprising: for i=1, . . . , N, exposing a pixel (i) of a same radiation detector to a radiation (i) thereby causing an apparent signal (i) in the pixel (i), wherein the pixel (i) is at a temperature (i) at the time the pixel (i) is exposed to the radiation (i); for i=1, . . . , N, determining the temperature (i) of the pixel (i); and for i=1, . . . , N, determining an actual value (i) of a same radiation characteristic of the radiation (i) based on the apparent signal (i) and the temperature (i), wherein N is a positive integer. The radiation characteristic may be radiation intensity, radiation phase, or radiation polarization.