METHOD FOR EVALUATING REMAINING LIFE OF COMPONENT, FUNCTIONAL MODULE AND SYSTEM

METHOD FOR EVALUATING REMAINING LIFE OF COMPONENT, FUNCTIONAL MODULE AND SYSTEM

The present invention provides a remaining life assessment method, apparatus, and system for an electronic system, where the electronic system includes at least one electronic component. The remaining life assessment method for the electronic system includes the following steps: S1: acquiring stress...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CHEN, Weigang, LIU, Zhen, PANG, Jianguo
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CALCULATING
COMPUTING
COUNTING
DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES
PHYSICS
SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:The present invention provides a remaining life assessment method, apparatus, and system for an electronic system, where the electronic system includes at least one electronic component. The remaining life assessment method for the electronic system includes the following steps: S1: acquiring stress information of the electronic system every time interval, and aggregating data of the stress information within a time period to obtain a stress factor; S2: obtaining a failure rate of each component of the system based on the stress factor and a failure rate algorithm, thereby calculating a failure rate of the system; S3: obtaining the reliability life of the system based on the failure rate of the system and a mean time between failures of the system, to obtain a cumulative damage rate of the system within the time period; and S4: calculating the remaining life of the system based on the nominal life or fatigue life of the system. The present invention has good scalability and low cost, and can not only predict the remaining life of the electronic system in real time, but can also detect unexpected situations in the operation of the electronic system.