SEMICONDUCTOR DEVICE WITH CONDUCTIVE ELEMENT FORMED OVER DIELECTRIC LAYERS AND METHOD OF FABRICATION THEREFOR
An embodiment of a semiconductor device includes a semiconductor substrate (110), a first current-carrying electrode (140), and a second current-carrying electrode (145) formed over the semiconductor, a control electrode (150) formed over the semiconductor substrate between the first current carryin...
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Sprache: | eng ; fre ; ger |
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Zusammenfassung: | An embodiment of a semiconductor device includes a semiconductor substrate (110), a first current-carrying electrode (140), and a second current-carrying electrode (145) formed over the semiconductor, a control electrode (150) formed over the semiconductor substrate between the first current carrying electrode and the second current carrying electrode, and a first dielectric layer (160) disposed over the control electrode, and a second dielectric layer (170) disposed over the first dielectric layer. A first opening is formed in the second dielectric layer, adjacent the control electrode and the second current-carrying electrode, having a first edge laterally adjacent to and nearer the second current-carrying electrode, and a second edge laterally adjacent to and nearer to the control electrode, and a conductive element (180) formed over the first dielectric layer and within the first opening, wherein the portion of the conductive element formed within the first opening forms a first metal-insulator-semiconductor region (187) within the first opening. |
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