CONTROL SYSTEM AND METHOD FOR DETERMINING AN ILLUMINATION INTENSITY IN A FLUORESCENCE MICROSCOPE AND CORRESPONDING MICROSCOPE SYSTEM

The invention, essentially, relates to a control system (150) for automatedly determining an illumination intensity (Pk,) of a light source (120k) of a fluorescence microscope (100), the light source (120k) used for stimulating fluorophore (130) in a sample (110), and configured to vary the illumina...

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Bibliographische Detailangaben
Hauptverfasser: SCHUMANN, Christian, Dr, RITSCHEL, Kai, Dr
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:The invention, essentially, relates to a control system (150) for automatedly determining an illumination intensity (Pk,) of a light source (120k) of a fluorescence microscope (100), the light source (120k) used for stimulating fluorophore (130) in a sample (110), and configured to vary the illumination intensity (Pk,), and the microscope (100) having a detector (140) for detecting an image intensity (B) of the sample (110), the control system (150) configured to: automatedly determining (304), after a change (302) in a light path (164, 168) a control value for he illumination intensity (Pk,) of the at least one light source (120k) in order to achieve a desired value of an inspection parameter (B) characterizing sample inspection, wherein determining (304) the control value for the illumination intensity (Pk,) of the at least one light source (120k) is based on a value of the illumination intensity (Pk,) that was set before the change (302) in the light path (164, 168), on a value of the inspection parameter (B) used before the change (302) in the light path, and on a physical model (M) of the light path (164, 168), the physical model mapping the illumination intensity (Pk,) of the at least one light source (120k) to the inspection parameter (B), taking into account imaging characteristics of optical components (124, 132, 160m, 160m+1) in the light path (164, 168), to a microscope system and corresponding methods.