CONTACTOR, INSPECTION JIG, INSPECTION DEVICE, AND METHOD FOR MANUFACTURING SAID CONTACTOR

A contact that is easily manufactured, an inspection jig using the contact, an inspection device, and a method of manufacturing the contact are provided. A contact Pr includes a coil spring CS in which a slit SL is formed in a cylindrical body F and first and second conductors P1 and P2. A bottom wa...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	OTA, Norihiro
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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