CONTACTOR, INSPECTION JIG, INSPECTION DEVICE, AND METHOD FOR MANUFACTURING SAID CONTACTOR

A contact that is easily manufactured, an inspection jig using the contact, an inspection device, and a method of manufacturing the contact are provided. A contact Pr includes a coil spring CS in which a slit SL is formed in a cylindrical body F and first and second conductors P1 and P2. A bottom wa...

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Bibliographische Detailangaben
1. Verfasser:	OTA, Norihiro
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	A contact that is easily manufactured, an inspection jig using the contact, an inspection device, and a method of manufacturing the contact are provided. A contact Pr includes a coil spring CS in which a slit SL is formed in a cylindrical body F and first and second conductors P1 and P2. A bottom wall portion F4, a first side wall portion F1, a second side wall portion F2, and a top wall portion F3 are configured such that a cross-sectional shape of the cylindrical body F as viewed in the axial direction is rectangular, the slit SL includes a first slit SL1, a second slit SL2, a third slit SL3, and a fourth slit SL4, the third slit SL3 is continuous with the first slit SL1 and the second slit SL2, the fourth slit SL4 is continuous with the second slit SL2, the first slit SL1 and the second slit SL2 are rectangular in a side view of the cylindrical body F, the first conductor P1 is connected to a first end portion Fx1 of the cylindrical body F, and the second conductor P2 is connected to a second end portion Fx2 of the cylindrical body F.