A MEASURING APPARATUS AND A MEASURING METHOD OF ELECTROMAGNETIC INTERFERENCE

The present invention relates to a measuring apparatus, comprising:- an arbitrary waveform generator to generate, and inject to a coupling network, a combination of N test signals;- the coupling network to couple the N test signals to an EUT, and the responses thereof and those signals generated by...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	RIBÓ PAL, Miquel, REGUE MORRERES, Joan Ramon, PAJARES VEGA, Francisco Javier, SANCHEZ DELGADO, Albert Miquel
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present invention relates to a measuring apparatus, comprising:- an arbitrary waveform generator to generate, and inject to a coupling network, a combination of N test signals;- the coupling network to couple the N test signals to an EUT, and the responses thereof and those signals generated by the EUT itself, to a measuring unit;- the measuring unit to measure the electrical signals provided by the coupling network; and- a processing unit to process the N test signals and the measured electrical signals, to obtain:- the electromagnetic signals, noise or EMI generated by the EUT; and- the Z, Y or S parameters of the EUT or any other meaningful set of parameters that can be computed from the aforementioned ones or from voltages and currents.The invention also relates to a measuring method adapted to perform method steps with the apparatus of the invention.