PHOTOVOLTAIC DEVICE TEST METHOD AND TEST APPARATUS

The present invention provides a method for measuring and calculating a current-voltage curve (IV) and a current mismatch between junctions of a tandem solar cell (100), comprising at least two solar subcells, the method being performed under simulated solar irradiance according to the international...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Bätzner, Derk, Bassi, Nicolas, Arnoux, Gilles, Frick, Nicolas
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:The present invention provides a method for measuring and calculating a current-voltage curve (IV) and a current mismatch between junctions of a tandem solar cell (100), comprising at least two solar subcells, the method being performed under simulated solar irradiance according to the international standard illumination AM1.5.The method implies the illumination by a first broad-spectral band light source S1 and comprises steps for calculating the necessary light intensities of narrowband second and said third light sources (S21, S22). The steps of the method achieve to determine adapted gains for second and said third light sources (S21, S22), so that the combination (S2) of said light sources S21 and S22 provide the same test results of the solar cell (100) as when illuminated with said first light source S1 only.The invention also provides a solar cell test apparatus (1) configured to realize the method of the invention.