METHOD OF DETERMINING AT LEAST ONE TOLERANCE BAND LIMIT VALUE FOR A TECHNICAL VARIABLE UNDER TEST AND CORRESPONDING CALCULATION DEVICE

Disclosed is a method of determining at least one tolerance band limit value for a technical variable under test. The method includes obtaining the at least one tolerance band limit value from sample tolerance band limit values of different samples, wherein the samples comprise values of the technic...

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Hauptverfasser: STRACKE, Patric Ralph, KNICKER, Florian, REUSS, Christian, WECKBACHER, Christian
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:Disclosed is a method of determining at least one tolerance band limit value for a technical variable under test. The method includes obtaining the at least one tolerance band limit value from sample tolerance band limit values of different samples, wherein the samples comprise values of the technical variable under test of the associated sample, wherein obtaining the at least one tolerance band limit value comprises using a location measure of a distribution according to which the sample tolerance band limit values are distributed, wherein the technical variable under test is distributed according to an underlying extreme value distribution function, wherein each of the sample tolerance band limit values is calculable using a sample-specific conditional probability distribution function which is a function of sample values of the sample, and wherein the technical variable relates to a physical characteristic of a product that is producible in an industrial mass production process.