DETECTION CIRCUIT AND INTEGRATED CIRCUIT
A detection circuit and an integrated circuit. The detection circuit is used for detecting the drift or an open circuit of a first capacitor (CI) on a filtered second power source terminal (220), and the second power source terminal (220) is suitable for acquiring a power source voltage from an unfi...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | A detection circuit and an integrated circuit. The detection circuit is used for detecting the drift or an open circuit of a first capacitor (CI) on a filtered second power source terminal (220), and the second power source terminal (220) is suitable for acquiring a power source voltage from an unfiltered first power source terminal (210) by means of a first resistor (Rl), and is suitable for being coupled to a reference electric potential terminal (230) by means of the first capacitor (Cl) so as to filter the power source voltage. The detection circuit comprises a second resistor (R2) and a second capacitor (C2) that are connected in series and coupled between the first power source terminal (210) and the reference electric potential terminal (230), wherein the second resistor (R2) and the second capacitor (C2) have the same time constant as the first resistor (Rl) and the first capacitor (CI); a simulated power source terminal (310) connected between the second resistor (R2) and the second capacitor (C2); and a comparator (320) that is coupled to the second power source terminal (220) and the simulated power source terminal (310) and suitable for measuring a voltage difference between a filtered power source voltage of the second power source terminal (220) and a simulated power source voltage of the simulated power source terminal (310), wherein the voltage difference indicates the degree of drift or the open circuit of the first capacitor (CI). The detection circuit can measure the degree of drift or an open circuit of an external capacitor of an integrated circuit, and has the advantages of easy integration and low cost. |
---|