COMPRESSOR, MONITORING SYSTEM, AND METHOD OF MONITORING COMPRESSOR

A compressor, a monitoring system and a method of monitoring a compressor that make it possible to monitor the remaining lifetime of a semiconductor element of a motor control system while the processing load is reduced are provided. A compressor (1) includes: a motor control system (10) that contro...

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Bibliographische Detailangaben
Hauptverfasser:	TAKANUKI, Akihiro, TASHIMA, Kiyomi, OKUBO, Tomofumi, SUZUKI, Norinaga
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS BLASTING CONTROL OR REGULATION OF ELECTRIC MOTORS, ELECTRIC GENERATORSOR DYNAMO-ELECTRIC CONVERTERS CONTROL OR REGULATION THEREOF CONTROLLING TRANSFORMERS, REACTORS OR CHOKE COILS CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ELECTRICITY GENERATION HEATING LIGHTING MECHANICAL ENGINEERING POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS PUMPS FOR LIQUIDS OR ELASTIC FLUIDS WEAPONS
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Beschreibung
Zusammenfassung:	A compressor, a monitoring system and a method of monitoring a compressor that make it possible to monitor the remaining lifetime of a semiconductor element of a motor control system while the processing load is reduced are provided. A compressor (1) includes: a motor control system (10) that controls the rotation speed of a motor (2); a compressor body (3) that compresses air by being driven by the motor (2); a pressure sensor (20) that is provided on the discharge side of the compressor body (3); and a running controller (11) that performs switching between load running and no-load running on the basis of the pressure sensed by the pressure sensor (20). A motor controller (26) of the motor control system (10) calculates a relative temperature of a semiconductor element relative to a reference temperature by using a temperature of the semiconductor element sensed by a temperature sensor (27) at the time of switching from no-load running to load running, and calculates an amount of change in a remaining lifetime of the semiconductor element corresponding to the relative temperature of the semiconductor element, whereby monitoring the remaining lifetime of the semiconductor element.