TOPOLOGICAL QUANTUM COMPUTING COMPONENTS, SYSTEMS AND METHODS

A method for monitoring the state of a qubit device comprising a chiral nanocrystal includes measuring a voltage, a current, or a magnetic field of the nanocrystal; assigning the nanocrystal a superposition state if the measured voltage, current, or magnetic field is less than a superposition thresh...

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Bibliographische Detailangaben
Hauptverfasser:	CARROLL, David, L, REICH, Alton, J, Di SALVO, Roberto
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES NANOTECHNOLOGY PERFORMING OPERATIONS PHYSICS SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TRANSPORTING
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Beschreibung
Zusammenfassung:	A method for monitoring the state of a qubit device comprising a chiral nanocrystal includes measuring a voltage, a current, or a magnetic field of the nanocrystal; assigning the nanocrystal a superposition state if the measured voltage, current, or magnetic field is less than a superposition threshold; and assigning a base state value of the nanocrystal if the measured voltage is greater than a base state threshold. The measured voltage, current, or magnetic field corresponds to a clockwise or counter clockwise flow of electrons around the nanocrystal.