SPRING CONTACT AND TEST SOCKET HAVING SPRING CONTACT EMBEDDED THEREIN

SPRING CONTACT AND TEST SOCKET HAVING SPRING CONTACT EMBEDDED THEREIN

A test socket of the present invention comprises: a plurality of spring contacts, each of which includes an upper contact pin, a lower contact pin, and a coil spring for elastically supporting the upper contact pin and the lower contact pin; a main plate including a plurality of receiving holes form...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HWANG, Dong Weon, HWANG, Jae Baek, HWANG, Logan Jae
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A test socket of the present invention comprises: a plurality of spring contacts, each of which includes an upper contact pin, a lower contact pin, and a coil spring for elastically supporting the upper contact pin and the lower contact pin; a main plate including a plurality of receiving holes formed to allow the spring contacts to be received and positioned therein, respectively, and including first openings, each of which is formed to have a diameter (d2) smaller than the diameter (d1) of the receiving hole so as to support the upper contact pin; and a film plate disposed under the main plate and including second openings, each of which is formed at a position corresponding to the receiving hole, and has a diameter (d3) smaller than the diameter (d1) of the receiving hole so as to support the lower contact pin (120).