PLANT PICKERS, AND RELATED METHODS ASSOCIATED WITH YIELD DETECTION

Systems and methods are provided for adapting picker yield data collected by pickers (e.g., ear pickers, combines, etc.) to account for errors in calibration of the pickers. One exemplary computer-implemented method includes accessing data for a field harvested by multiple pickers, wherein the acces...

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Bibliographische Detailangaben
Hauptverfasser: CARTIER, Adrian A.W, SREERAM, Vallapakrishna, LA ROSA ARAYA, Patricio S, KOLBET, Mackenzie A, SHERIDAN, Alexander H, CHEN, Fei, MORRIS, E. Scott
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:Systems and methods are provided for adapting picker yield data collected by pickers (e.g., ear pickers, combines, etc.) to account for errors in calibration of the pickers. One exemplary computer-implemented method includes accessing data for a field harvested by multiple pickers, wherein the accessed data includes yield data for the field received from of the pickers, and determining a mass differential for a crop harvested by the pickers from the field. When the mass differential exceeds a threshold, the method then further includes calculating a normalization factor for at least one pair of the pickers, calculating a scaling factor associated with one of the pickers of the at least one pair of the pickers based on the normalization factor, and applying the scaling factor to the yield data received from the pickers such that the yield data is normalized.