OUTLIER DETECTION FOR SPECTROSCOPIC CLASSIFICATION

OUTLIER DETECTION FOR SPECTROSCOPIC CLASSIFICATION

In some implementations, a device may determine that an unknown sample is an outlier sample by using an aggregated classification model. The device may determine that one or more spectroscopic measurements are not performed accurately based on determining that the unknown sample is the outlier sampl...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SUN, Lan, HSIUNG, Chang Meng
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
PHYSICS
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Beschreibung
Zusammenfassung:In some implementations, a device may determine that an unknown sample is an outlier sample by using an aggregated classification model. The device may determine that one or more spectroscopic measurements are not performed accurately based on determining that the unknown sample is the outlier sample. The device may cause one or more actions based on determining the one or more spectroscopic measurements are not performed accurately.