DATA ACQUISITION AND PROCESSING TECHNIQUES FOR THREE-DIMENSIONAL RECONSTRUCTION
Apparatuses and processes for generating data for three-dimensional reconstruction are disclosed herein. An example method at least includes exposing a subsequent surface of a sample, acquiring an image of the subsequent surface, comparing the image of the subsequent surface to an image of a referen...
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| creator | Vystavel, Tomás Kaplenko, Oleksii Van Leer, Brandon Machek, Ondrej Kaplenko, Mykola Wandrol, Petr |
| description | Apparatuses and processes for generating data for three-dimensional reconstruction are disclosed herein. An example method at least includes exposing a subsequent surface of a sample, acquiring an image of the subsequent surface, comparing the image of the subsequent surface to an image of a reference surface, based on the comparison exceeding a threshold, acquiring a compositional or crystalline map of the subsequent surface, and based on the comparison not exceeding the threshold, exposing a next surface. Such method of the type slice-and-view allows to reduce the overall processing time of the reconstruction since the compositional or crystalline map of a subsequent surface is measured only if the corresponding image shows significant changes. Artificial neural networks are used to propagate the compositional or crystalline map information for slices where no map has been measured. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4024039A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4024039A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4024039A13</originalsourceid><addsrcrecordid>eNqNy7EKwjAQgOEsDqK-w71AodoujuFyNQd6aZPLXIrESbRQ3x8VfACnf_n-tQnOqgWLQ-bEykHAioM-BqSUWE6ghF54yJSgCxHUR6LK8YUkfbQ9QyQMkjRm_O5bs7pN96Xsft0Y6EjRV2V-jmWZp2t5lNdIfVsf2ro52n3zB3kDG9Uu1w</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DATA ACQUISITION AND PROCESSING TECHNIQUES FOR THREE-DIMENSIONAL RECONSTRUCTION</title><source>esp@cenet</source><creator>Vystavel, Tomás ; Kaplenko, Oleksii ; Van Leer, Brandon ; Machek, Ondrej ; Kaplenko, Mykola ; Wandrol, Petr</creator><creatorcontrib>Vystavel, Tomás ; Kaplenko, Oleksii ; Van Leer, Brandon ; Machek, Ondrej ; Kaplenko, Mykola ; Wandrol, Petr</creatorcontrib><description>Apparatuses and processes for generating data for three-dimensional reconstruction are disclosed herein. An example method at least includes exposing a subsequent surface of a sample, acquiring an image of the subsequent surface, comparing the image of the subsequent surface to an image of a reference surface, based on the comparison exceeding a threshold, acquiring a compositional or crystalline map of the subsequent surface, and based on the comparison not exceeding the threshold, exposing a next surface. Such method of the type slice-and-view allows to reduce the overall processing time of the reconstruction since the compositional or crystalline map of a subsequent surface is measured only if the corresponding image shows significant changes. Artificial neural networks are used to propagate the compositional or crystalline map information for slices where no map has been measured.</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220706&DB=EPODOC&CC=EP&NR=4024039A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220706&DB=EPODOC&CC=EP&NR=4024039A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Vystavel, Tomás</creatorcontrib><creatorcontrib>Kaplenko, Oleksii</creatorcontrib><creatorcontrib>Van Leer, Brandon</creatorcontrib><creatorcontrib>Machek, Ondrej</creatorcontrib><creatorcontrib>Kaplenko, Mykola</creatorcontrib><creatorcontrib>Wandrol, Petr</creatorcontrib><title>DATA ACQUISITION AND PROCESSING TECHNIQUES FOR THREE-DIMENSIONAL RECONSTRUCTION</title><description>Apparatuses and processes for generating data for three-dimensional reconstruction are disclosed herein. An example method at least includes exposing a subsequent surface of a sample, acquiring an image of the subsequent surface, comparing the image of the subsequent surface to an image of a reference surface, based on the comparison exceeding a threshold, acquiring a compositional or crystalline map of the subsequent surface, and based on the comparison not exceeding the threshold, exposing a next surface. Such method of the type slice-and-view allows to reduce the overall processing time of the reconstruction since the compositional or crystalline map of a subsequent surface is measured only if the corresponding image shows significant changes. Artificial neural networks are used to propagate the compositional or crystalline map information for slices where no map has been measured.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNy7EKwjAQgOEsDqK-w71AodoujuFyNQd6aZPLXIrESbRQ3x8VfACnf_n-tQnOqgWLQ-bEykHAioM-BqSUWE6ghF54yJSgCxHUR6LK8YUkfbQ9QyQMkjRm_O5bs7pN96Xsft0Y6EjRV2V-jmWZp2t5lNdIfVsf2ro52n3zB3kDG9Uu1w</recordid><startdate>20220706</startdate><enddate>20220706</enddate><creator>Vystavel, Tomás</creator><creator>Kaplenko, Oleksii</creator><creator>Van Leer, Brandon</creator><creator>Machek, Ondrej</creator><creator>Kaplenko, Mykola</creator><creator>Wandrol, Petr</creator><scope>EVB</scope></search><sort><creationdate>20220706</creationdate><title>DATA ACQUISITION AND PROCESSING TECHNIQUES FOR THREE-DIMENSIONAL RECONSTRUCTION</title><author>Vystavel, Tomás ; Kaplenko, Oleksii ; Van Leer, Brandon ; Machek, Ondrej ; Kaplenko, Mykola ; Wandrol, Petr</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4024039A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Vystavel, Tomás</creatorcontrib><creatorcontrib>Kaplenko, Oleksii</creatorcontrib><creatorcontrib>Van Leer, Brandon</creatorcontrib><creatorcontrib>Machek, Ondrej</creatorcontrib><creatorcontrib>Kaplenko, Mykola</creatorcontrib><creatorcontrib>Wandrol, Petr</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Vystavel, Tomás</au><au>Kaplenko, Oleksii</au><au>Van Leer, Brandon</au><au>Machek, Ondrej</au><au>Kaplenko, Mykola</au><au>Wandrol, Petr</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DATA ACQUISITION AND PROCESSING TECHNIQUES FOR THREE-DIMENSIONAL RECONSTRUCTION</title><date>2022-07-06</date><risdate>2022</risdate><abstract>Apparatuses and processes for generating data for three-dimensional reconstruction are disclosed herein. An example method at least includes exposing a subsequent surface of a sample, acquiring an image of the subsequent surface, comparing the image of the subsequent surface to an image of a reference surface, based on the comparison exceeding a threshold, acquiring a compositional or crystalline map of the subsequent surface, and based on the comparison not exceeding the threshold, exposing a next surface. Such method of the type slice-and-view allows to reduce the overall processing time of the reconstruction since the compositional or crystalline map of a subsequent surface is measured only if the corresponding image shows significant changes. Artificial neural networks are used to propagate the compositional or crystalline map information for slices where no map has been measured.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | DATA ACQUISITION AND PROCESSING TECHNIQUES FOR THREE-DIMENSIONAL RECONSTRUCTION |
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