METHOD AND SYSTEM FOR DETERMINING AT LEAST ONE PARAMETER OF INTEREST OF A MATERIAL

A method for determining at least one parameter of interest of a material comprises directing, using a radio frequency (RF) applicator, one or more RF energy pulses into a region of interest, the region of interest comprising a material having a parameter of interest and at least one reference, the...

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Bibliographische Detailangaben
1. Verfasser: CHO, Jang Hwan
Format: Patent
Sprache:eng ; fre ; ger
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