METHOD AND SYSTEM FOR DETERMINING AT LEAST ONE PARAMETER OF INTEREST OF A MATERIAL

A method for determining at least one parameter of interest of a material comprises directing, using a radio frequency (RF) applicator, one or more RF energy pulses into a region of interest, the region of interest comprising a material having a parameter of interest and at least one reference, the...

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Bibliographische Detailangaben
1. Verfasser: CHO, Jang Hwan
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:A method for determining at least one parameter of interest of a material comprises directing, using a radio frequency (RF) applicator, one or more RF energy pulses into a region of interest, the region of interest comprising a material having a parameter of interest and at least one reference, the material and the reference separated by at least one boundary; detecting, using an acoustic receiver, at least one multi-polar acoustic signal generated in the region of interest in response to the RF energy pulses; processing the at least one multi-polar acoustic signal to determine an electric field strength at the boundary; calculating a voltage standing wave ratio (VSWR) of the one or more RF energy pulses; and determining the at least one parameter of interest of the material based at least on the determined electric field strength and the VSWR.