OFFSET WELL ANALYSIS USING WELL TRAJECTORY SIMILARITY

A system and method that include receiving offset well data collected from an offset well, wherein the offset well data comprises data representing a trajectory of an offset. The system and method also include receiving subject well data comprising a trajectory of at least a portion of a subject. Th...

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Bibliographische Detailangaben
Hauptverfasser: SUO, Xiaotong, VESSELINOV, Velizar, EKLUND, Neil Holger White, CELAYA GALVAN, Jose, ZHERNAKOV, Vladimir
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:A system and method that include receiving offset well data collected from an offset well, wherein the offset well data comprises data representing a trajectory of an offset. The system and method also include receiving subject well data comprising a trajectory of at least a portion of a subject. The system and method additionally include determining a similarity value between the trajectory of the offset well and the subject well. The system and method also include selecting at least one offset well for offset well analysis based on the similarity value. The system and method further include adjusting at least one parameter of the subject well based on the offset well analysis.