PANEL RETARDANCE MEASUREMENT

A method for determining a residual retardance of an LCOS (Liquid Crystal on Silicon) panel includes transmitting a light beam to the LCOS panel at an angle of incidence and measuring an intensity of a reflected light beam. The method includes biasing the LCOS panel in a dark state and measuring a d...

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Bibliographische Detailangaben
Hauptverfasser: SCHUCK, Miller Harry III, AREND, Erik Heath, SISSOM, Bradley Jay, HALL, Heidi Leising, MACIAS ROMERO, Carlos Alberto, ZAGOLLA, Volker
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:A method for determining a residual retardance of an LCOS (Liquid Crystal on Silicon) panel includes transmitting a light beam to the LCOS panel at an angle of incidence and measuring an intensity of a reflected light beam. The method includes biasing the LCOS panel in a dark state and measuring a dark state intensity of the reflected light beam. The method also includes biasing the LCOS panel in a bright state, and measuring a bright state intensity of the reflected light beam. A residual retardance of the LCOS panel is determined based on a contrast ratio of the bright state intensity and the dark state intensity. The method can also include selecting a compensator for the LCOS panel based on the residual retardance.