METHOD OF DETERMINING AN INTERFACE HEIGHT OF AN INTERFACE BETWEEN AN UPPER AND A LOWER LAYER COMPRISED IN A THICKENER

METHOD OF DETERMINING AN INTERFACE HEIGHT OF AN INTERFACE BETWEEN AN UPPER AND A LOWER LAYER COMPRISED IN A THICKENER

A method of determining an interface height in a container of a thickener includes measuring said interface height with a level measurement device during time periods, when conditions permit, measuring process variables related to the thickening process performed by the thickener and calculating and...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MCKERTICH, Taylor, BRENZINGER, Matthias, CADIZ, Nicolas, GHEEWALA, Jenish, NAIDOO, Dhiren, VAISSIERE, Dimitri
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
MEASURING
MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL
METERING BY VOLUME
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method of determining an interface height in a container of a thickener includes measuring said interface height with a level measurement device during time periods, when conditions permit, measuring process variables related to the thickening process performed by the thickener and calculating and providing a calculated interface height, wherein a calculating unit is designed to learn said calculation based on said measured interface heights and said measured process variables.