DETECTING PROCESS PARAMETERS OF AN ASSEMBLY LINE

Various embodiments of the teachings herein include a device for detecting process parameters during a pass through an assembly line for assembling electronic components and/or for applying joining materials. The device may include: a carrier for transport by a conveying system of the assembly line...

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Bibliographische Detailangaben
Hauptverfasser: WITTREICH, Ulrich, SCHUBERT, Jörg, MASSIERER, Jonas, JARCHOFF, Kay, MATIWE, Marco, HANISCH, Michael, WORMUTH, Dirk, SOMMERFELD, Dennis
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:Various embodiments of the teachings herein include a device for detecting process parameters during a pass through an assembly line for assembling electronic components and/or for applying joining materials. The device may include: a carrier for transport by a conveying system of the assembly line and configured to receive a test plate; a sensor for measuring a process parameter during the pass; and a force sensor arranged to detect a force acting on the test plate during the pass.