METHOD OF MANUFACTURING AN INTEGRATED CIRCUIT INVOLVING PERFORMING AN ELECTROSTATIC DISCHARGE TEST

In a method of manufacturing an integrated circuit involving performing an electrostatic discharge, ESD, test, a weak frequency band is detected by sequentially radiating a plurality of first electromagnetic waves on a first test board (200) including the integrated circuit. First peak-to-peak volta...

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Bibliographische Detailangaben

Hauptverfasser:	KANG, Bonggyu, JANG, Youngsoo, KIM, Heesu
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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