CALIBRATION CURVE SETTING METHOD, SPECIMEN ANALYSIS METHOD, CALIBRATION CURVE SETTING PROGRAM, SPECIMEN ANALYSIS PROGRAM, AND SPECIMEN ANALYZER

Disclosed is a calibration curve setting method for setting a calibration curve, the calibration curve setting method including: creating a first calibration curve on the basis of a measurement value obtained by measuring a standard sample for which a concentration of a predetermined component is kn...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Kato, Akihito, Kurono, Hiroshi
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Disclosed is a calibration curve setting method for setting a calibration curve, the calibration curve setting method including: creating a first calibration curve on the basis of a measurement value obtained by measuring a standard sample for which a concentration of a predetermined component is known; creating a second calibration curve by correcting the created first calibration curve; displaying a screen configured to support an operator for restoring the second calibration curve to the first calibration curve; receiving an instruction of restoring the second calibration curve to the first calibration curve; and displaying the first calibration curve upon receiving the instruction of restoring.