SYSTEM AND METHOD FOR AUTOMATIC EVOKED POTENTIAL MEASUREMENT

A system and method is operable to automatically determine the amplitude and latency of one or more evoked potential (EP) or event-related potential (ERP) from electroencephalography (EEG) data. The EEG data from an EEG scan is separated into one or more epochs containing the desired EP or ERP wavef...

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Hauptverfasser: BOLLINGER, Fabio, GHOSH HAJRA, Sujoy, SMITH, Christopher James, LIVINGSTONE, Ashley Candice, HAMZEI, Nazanin, FICKLING, Shaun Dean, YEE, Evangeline, LIU, Careesa Chang, GURM, Sunny, FREHLICK, Zachary, D'ARCY, Ryan Clarke Newell, TANNOURI, Pamela, THIEM, Mike
Format: Patent
Sprache:eng ; fre ; ger
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