SYSTEM AND METHOD FOR AUTOMATIC EVOKED POTENTIAL MEASUREMENT

A system and method is operable to automatically determine the amplitude and latency of one or more evoked potential (EP) or event-related potential (ERP) from electroencephalography (EEG) data. The EEG data from an EEG scan is separated into one or more epochs containing the desired EP or ERP wavef...

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Bibliographische Detailangaben
Hauptverfasser:	BOLLINGER, Fabio, GHOSH HAJRA, Sujoy, SMITH, Christopher James, LIVINGSTONE, Ashley Candice, HAMZEI, Nazanin, FICKLING, Shaun Dean, YEE, Evangeline, LIU, Careesa Chang, GURM, Sunny, FREHLICK, Zachary, D'ARCY, Ryan Clarke Newell, TANNOURI, Pamela, THIEM, Mike
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	DIAGNOSIS HEALTHCARE INFORMATICS, i.e. INFORMATION AND COMMUNICATIONTECHNOLOGY [ICT] SPECIALLY ADAPTED FOR THE HANDLING ORPROCESSING OF MEDICAL OR HEALTHCARE DATA HUMAN NECESSITIES HYGIENE IDENTIFICATION INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTEDFOR SPECIFIC APPLICATION FIELDS MEDICAL OR VETERINARY SCIENCE PHYSICS SURGERY
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Beschreibung
Zusammenfassung:	A system and method is operable to automatically determine the amplitude and latency of one or more evoked potential (EP) or event-related potential (ERP) from electroencephalography (EEG) data. The EEG data from an EEG scan is separated into one or more epochs containing the desired EP or ERP waveforms. Epochs corresponding to the same type of EP or ERP such as N100, P300, and N400 are averaged automatically. The averaged epochs are automatically filtered in the time-frequency domain using an automatically selected filtering mask associated with the type of EP or ERP. A corresponding peak is automatically identified from the filtered epoch, in which the amplitude and latency is automatically measured.