POSITION-MEASURING DEVICE FOR MEASURING AN ABSOLUTE POSITION

A position-measuring device and a corresponding method for measuring an absolute position includes a material measure having a first binary code and a second binary code and a sensor device that scans the first and second binary codes. The sensor device scans the first binary code, which has a first...

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Bibliographische Detailangaben
Hauptverfasser:	FISCHER, Peter, HERZ, Manfred, WACHTER, Christian, SCHERNER, Hartmut, KÜLLER, Christian
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A position-measuring device and a corresponding method for measuring an absolute position includes a material measure having a first binary code and a second binary code and a sensor device that scans the first and second binary codes. The sensor device scans the first binary code, which has a first number of code words, each having the same code word length. The second binary code of the material measure forms a portion of the first binary code and has a second number of the code words that can be mapped onto the first binary code.