METHOD OF FORMING MOISTURE AND OXYGEN BARRIER COATINGS
Embodiments of the present invention generally relate to methods of forming moisture and oxygen barrier films on substrates. A barrier layer is deposited on a substrate in an atomic layer deposition chamber using atomic layer deposition to reduce a water vapor transmission rate and an oxygen transmi...
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Zusammenfassung: | Embodiments of the present invention generally relate to methods of forming moisture and oxygen barrier films on substrates. A barrier layer is deposited on a substrate in an atomic layer deposition chamber using atomic layer deposition to reduce a water vapor transmission rate and an oxygen transmission rate of the substrate. The barrier layer is deposited at 1 atm and at a temperature between about 25 degrees Celsius to about 5 degrees Celsius below a melting point of the substrate. The substrate may be optionally plasma treated prior to depositing the barrier layer to enhance the adhesion of the barrier layer to the substrate. One or more additional layers, such as layers comprising polymers, may be deposited on the barrier layer to further reduce the water vapor transmission rate and/or the oxygen transmission rate. |
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