DEVICE AND METHOD FOR MEASURING SEMICONDUCTOR-BASED LIGHT SOURCES

The invention relates to a method for the sequential measurement of a plurality of semiconductor-based light sources such as LEDs, OLEDs or VCSELs, in particular comparatively low-luminosity light sources such as so-called micro-LEDs. The invention further relates to a device for carrying out the method. The object of the present invention is to provide a method that operates faster, more accurately and more sensitively than the known methods, which operate by scanning with a photodiode or with a spectrometer. The method according to the invention proposes for this that a current pulse is applied by means of a pulsed current source (1) to the low-luminosity light sources consecutively or simultaneously. The emitted light pulse of the LED (2) is converted into electric charge carriers by means of a photodiode (3), the electric charge carriers are added up by means of an integrator circuit (5), the added-together charge carriers are converted by means of an A/D converter (6) into a digital signal and the digital signal is forwarded to a measurement and control unit (7). The invention also relates to a method and a corresponding device for the sequential measurement of a plurality of optical pulses, wherein the pulsed light radiation enters an Ulbricht sphere (10) through an inlet opening (11), a first portion of the light radiation, which exits the Ulbricht sphere (10) following interaction with the same through a first outlet opening, is measured by means of a first detector (14, 18) and a second portion of the light radiation, which exits the Ulbricht sphere (10) without interaction with the same through a second outlet opening (19), is measured by means of a second detector (14′).