TEST KIT FOR TESTING A DEVICE UNDER TEST

TEST KIT FOR TESTING A DEVICE UNDER TEST

A test kit for testing a device under test, DUT, (130) includes a socket structure for containing the DUT (130). The DUT includes an antenna (AT) and radiates a RF signal. The test kit further includes a reflector (230) having a lower surface (230b). The RF signal emitted from the antenna (AT) of th...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SHIH, Ying-Chou, LEI, Sheng-Wei, LU, Yen-Ju, KAO, Yeh-Chun, TSENG, Po-Sen, WEI, Chang-Lin
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A test kit for testing a device under test, DUT, (130) includes a socket structure for containing the DUT (130). The DUT includes an antenna (AT) and radiates a RF signal. The test kit further includes a reflector (230) having a lower surface (230b). The RF signal emitted from the antenna (AT) of the DUT (130) is reflected by the reflector (230) and a reflected RF signal is received by the antenna (AT) of the DUT (130).