SURFACE ROUGHNESS ANALYSIS SYSTEM AND METHOD OF ANALYZING SURFACE ROUGHNESS OF A WORKPIECE

SURFACE ROUGHNESS ANALYSIS SYSTEM AND METHOD OF ANALYZING SURFACE ROUGHNESS OF A WORKPIECE

A surface roughness analysis system and methods of analyzing surface roughness of a workpiece are presented. The surface roughness analysis system comprises a number of wave generators; a number of wave sensors; and an ultrasonic analysis system configured to receive material mechanical parameters f...

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Hauptverfasser: JAHANBIN, Shahrooz M, GEORGESON, Gary E, IHN, Jeong-Beom, DESAI, Nihar Ashokkumar
Format: Patent
Sprache:eng ; fre ; ger
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator JAHANBIN, Shahrooz M
GEORGESON, Gary E
IHN, Jeong-Beom
DESAI, Nihar Ashokkumar
description A surface roughness analysis system and methods of analyzing surface roughness of a workpiece are presented. The surface roughness analysis system comprises a number of wave generators; a number of wave sensors; and an ultrasonic analysis system configured to receive material mechanical parameters for a workpiece, determine incident surface wave signal parameters for a source signal to be sent by the number of wave generators, and determine a cut-off wavelength using the material mechanical parameters, wherein the cut-off wavelength is a ratio of surface wavelength over incident wavelength.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title SURFACE ROUGHNESS ANALYSIS SYSTEM AND METHOD OF ANALYZING SURFACE ROUGHNESS OF A WORKPIECE
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