SURFACE ROUGHNESS ANALYSIS SYSTEM AND METHOD OF ANALYZING SURFACE ROUGHNESS OF A WORKPIECE

A surface roughness analysis system and methods of analyzing surface roughness of a workpiece are presented. The surface roughness analysis system comprises a number of wave generators; a number of wave sensors; and an ultrasonic analysis system configured to receive material mechanical parameters f...

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Bibliographische Detailangaben
Hauptverfasser:	JAHANBIN, Shahrooz M, GEORGESON, Gary E, IHN, Jeong-Beom, DESAI, Nihar Ashokkumar
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A surface roughness analysis system and methods of analyzing surface roughness of a workpiece are presented. The surface roughness analysis system comprises a number of wave generators; a number of wave sensors; and an ultrasonic analysis system configured to receive material mechanical parameters for a workpiece, determine incident surface wave signal parameters for a source signal to be sent by the number of wave generators, and determine a cut-off wavelength using the material mechanical parameters, wherein the cut-off wavelength is a ratio of surface wavelength over incident wavelength.