MEASURING CHIP, MEASURING DEVICE, AND MEASURING METHOD

Provided is a measuring chip, a measuring device and a measuring method, which are capable of performing a more simple and highly accurate measurement than the conventional measurement. Light introduced into an incoming part 11 may propagate while totally reflecting within a propagating part 13 of a propagation layer 101. A phase shift amount in the total internal reflection may be different between sections of an upper surface of the propagation layer 101 where a ligand 102 is formed and where a ligand 102 is not formed. When an analyte 201 is adsorbed to the ligand 102, the phase shift amount in the reflection may become larger than before attaching the analyte 201. As a result, a beam pattern of the light outputted from an outgoing part 17 may change.