SIGNAL ANALYSIS METHOD AND TEST SYSTEM

A signal analysis method of analyzing a performance of a device under test (12) is disclosed. The method comprises the following steps: A digitized input signal is obtained, wherein the digitized input signal is associated with the device under test (12). At least one characteristic quantity is dete...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	XIE, Feng, EICHLER, Taro
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A signal analysis method of analyzing a performance of a device under test (12) is disclosed. The method comprises the following steps: A digitized input signal is obtained, wherein the digitized input signal is associated with the device under test (12). At least one characteristic quantity is determined via an artificial intelligence module (18). The artificial intelligence module (18) comprises at least one computing parameter. The at least one characteristic quantity is determined based on the digitized input signal and based on the at least one computing parameter. The at least one characteristic quantity is indicative of at least one performance property of the device under test (12). Further, a test system (10) for analyzing a performance of a device under test (12) as well as a computer program are disclosed.