A LEAKAGE COMPENSATION CIRCUIT FOR A CAPACITIVE OR RESISTIVE MEASUREMENT DEVICE

It is described a leakage compensation circuit (120) for a measurement device (100) which comprises a measurement circuit (110) with a leaking device (111) that is connected to a measurement path (115) and causes a leakage current (112). The leakage compensation circuit (120) comprises: i) a replica...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Stadlmair, Rainer, Malinowski, Slawomir Rafal
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:It is described a leakage compensation circuit (120) for a measurement device (100) which comprises a measurement circuit (110) with a leaking device (111) that is connected to a measurement path (115) and causes a leakage current (112). The leakage compensation circuit (120) comprises: i) a replica device (121) of the leaking device (111), wherein the replica device (121) is connected to a replica path (125), and wherein the replica device (121) is configured to cause a replica leakage current (122a) that is essentially equal to the leakage current (112) of the leaking device (111), ii) a voltage regulator (130) which is connected to the measurement path (115) and to the replica path (125), wherein the voltage regulator (130) is configured to regulate the voltage in the replica path (125) based on the voltage of the measurement path (115), and iii) a current mirror (140) which is connected to the measurement path (115) and to the replica path (125), wherein the current mirror (140) is configured to mirror the replica leakage current (122a) of the replica device (121) into the measurement path (115).