X-RAY FLUORESCENCE ANALYSIS SYSTEM

Provided is an X-ray fluorescence spectrometric system capable of calculating an accurate measuring time. The X-ray fluorescence spectrometric system, which is configured to analyze a sample through use of fluorescent X-rays generated by irradiating a surface of the sample with primary X-rays, includes: a job execution unit configured to execute a job indicating a processing condition in which a recipe indicating a measurement condition formed by combining a plurality of operations required for the analysis and the sample to be measured under the measurement condition indicated by the recipe are associated with each other; a storage unit configured to store in advance a time required for each of the operations in association with the each of the operations; a calculation unit configured to calculate, when the job is generated, a time to be taken until execution of the job is completed, for each job based on the time stored in the storage unit; and a control unit configured to newly store, when the job is executed, a time taken for the operation in the storage unit in association with the operation. The calculation unit is configured to further calculate, when the job is executed, the time to be taken until the execution of the job is completed, based on the time newly stored in the storage unit.