APPARATUS FOR ANALYSIS FOR ADHESIVE MULTI-LAYER FILM AND METHOD THEREOF

The present disclosure relates to an apparatus and a method for analysis of a multi-layer adhesive film and provides the apparatus comprising a specimen tray unit; a blade unit; a liquid nitrogen supply unit; and a driving unit, and the method comprising a specimen fixing step; a specimen cooling st...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	CHOI, Bumgyu, KIM, Byoung Hyoun, LEE, Joon Seok, JANG, Rin, KIM, So Yeon, HAN, Su Youn
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present disclosure relates to an apparatus and a method for analysis of a multi-layer adhesive film and provides the apparatus comprising a specimen tray unit; a blade unit; a liquid nitrogen supply unit; and a driving unit, and the method comprising a specimen fixing step; a specimen cooling step; a specimen pre-collection step; a specimen collection step; and a blade separation step.