ELECTRICAL TEST PROBES HAVING DECOUPLED ELECTRICAL AND MECHANICAL DESIGN

ELECTRICAL TEST PROBES HAVING DECOUPLED ELECTRICAL AND MECHANICAL DESIGN

Probes for testing electrical circuits having decoupled electrical and mechanical design are provided. For example, a mechanically resilient core can be surrounded by an electrically conductive shell. In this way, electrical parameters of the probes are determined by the shells and mechanical parame...

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Hauptverfasser: SWART, Roy, KISTER, January, SIJERCIC, Edin
Format: Patent
Sprache:eng ; fre ; ger
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MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator SWART, Roy
KISTER, January
SIJERCIC, Edin
description Probes for testing electrical circuits having decoupled electrical and mechanical design are provided. For example, a mechanically resilient core can be surrounded by an electrically conductive shell. In this way, electrical parameters of the probes are determined by the shells and mechanical parameters of the probes are determined by the cores. An important application of this approach is to provide impedance matched transmission line probes.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title ELECTRICAL TEST PROBES HAVING DECOUPLED ELECTRICAL AND MECHANICAL DESIGN
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