ELECTRICAL TEST PROBES HAVING DECOUPLED ELECTRICAL AND MECHANICAL DESIGN

ELECTRICAL TEST PROBES HAVING DECOUPLED ELECTRICAL AND MECHANICAL DESIGN

Probes for testing electrical circuits having decoupled electrical and mechanical design are provided. For example, a mechanically resilient core can be surrounded by an electrically conductive shell. In this way, electrical parameters of the probes are determined by the shells and mechanical parame...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SWART, Roy, KISTER, January, SIJERCIC, Edin
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Probes for testing electrical circuits having decoupled electrical and mechanical design are provided. For example, a mechanically resilient core can be surrounded by an electrically conductive shell. In this way, electrical parameters of the probes are determined by the shells and mechanical parameters of the probes are determined by the cores. An important application of this approach is to provide impedance matched transmission line probes.