METALLIC TUBE STRUCTURE WITH A SENSOR ARRANGEMENT

Metallic tube structure comprises a first tubular portion and a sensor structure. A sensor of the sensor structure is configured to detect a physical parameter of the metallic tube structure. The sensor structure is formed as a stack of thin-film layers. The stack comprises at least a first electric...

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Bibliographische Detailangaben
Hauptverfasser:	EWERT, Anthony, SJÖBLOM, Gustaf
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	Metallic tube structure comprises a first tubular portion and a sensor structure. A sensor of the sensor structure is configured to detect a physical parameter of the metallic tube structure. The sensor structure is formed as a stack of thin-film layers. The stack comprises at least a first electrically insulating thin-film layer and at least one electrically conducting thin-film layer. The first electrically insulating thin-film layer is in mechanically bonded to the outer surface of the first tubular portion and is arranged to electrically insulate the at least one electrically conducting thin-film layer from the first tubular portion. A portion of the sensor structure is covered by a protective member, the protective member being arranged in direct contact with the at least a portion of the sensor structure and at least a part of the first tubular portion.