FAILURE CHARACTERIZATION SYSTEMS AND METHODS FOR PROGRAMMABLE LOGIC DEVICES

Systems and methods for failure characterization of secure programmable logic devices (PLDs) are disclosed. An example system includes a secure PLD including programmable logic blocks (PLBs) arrangedin PLD fabric of the secure PLD, and a configuration engine configured to program the PLD fabric acco...

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Bibliographische Detailangaben
Hauptverfasser: HAN, Wei, ZHANG, Fulong, CHANDRA, Srirama (Shyam), HEGADE, Sreepada, COPLEN, Joel, SUN, Yu
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:Systems and methods for failure characterization of secure programmable logic devices (PLDs) are disclosed. An example system includes a secure PLD including programmable logic blocks (PLBs) arrangedin PLD fabric of the secure PLD, and a configuration engine configured to program the PLD fabric according to a configuration image stored in non-volatile memory (NVM) of the secure PLD and/or coupledthrough a configuration input/output (I/O) of the secure PLD. The secure PLD is configured to receive a failure characterization (FC) command from the PLD fabric or an external system coupled to thesecure PLD through the configuration I/O, and to execute the FC command to, at least in part, erase and/or nullify portions of the NVM. The secure PLD may also be configured to boot a debug configuration for the PLD fabric that identifies and/or characterizes operational failures of the secure PLD.