X-RAY DETECTOR WITH FOCUSED SCINTILLATOR STRUCTURE FOR UNIFORM IMAGING

X-RAY DETECTOR WITH FOCUSED SCINTILLATOR STRUCTURE FOR UNIFORM IMAGING

A scintillator layer (SL) for X-ray imaging including at least one scintillator element (SE) capable of converting X-radiation into light, the element having two faces, an ingress face (S1) for admitting X-radiation into the element (SE) and an egress face (S2) distal from the ingress face (S1), whe...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: STEINHAUSER, Heidrun, WIMMERS, Onno, Jan
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A scintillator layer (SL) for X-ray imaging including at least one scintillator element (SE) capable of converting X-radiation into light, the element having two faces, an ingress face (S1) for admitting X-radiation into the element (SE) and an egress face (S2) distal from the ingress face (S1), wherein the two faces (S1,S2) are arranged shifted relative to each other, so that a longitudinal (LAX) axis of the scintillator element (SE) is inclined relative to a normal () of the layer.