DEVICE, SYSTEM AND METHOD FOR CONTROLLING A POSITION OF AN ANTI-SCATTER GRID IN AN X-RAY IMAGE ACQUISITION SYSTEM
The present invention relates to a device for controlling a position of an anti-scatter grid in an X-ray image acquisition system, the device (10) comprising: a measurement unit (12); a control unit (14); and a shifting unit (16); wherein the measurement unit (12) is configured to determine an X-ray...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | The present invention relates to a device for controlling a position of an anti-scatter grid in an X-ray image acquisition system, the device (10) comprising: a measurement unit (12); a control unit (14); and a shifting unit (16); wherein the measurement unit (12) is configured to determine an X-ray beam focus position (37) of an X-ray radiation source of the X-ray image acquisition system with respect to an X-ray detector of the X-ray image acquisition system; wherein the control unit (14) is configured to generate a shifting signal based on a displacement (18) between the X-ray beam focus position (37) and a grid focus position (35) of the anti-scatter grid; and wherein, based on the shifting signal, the shifting unit (16) is configured to shift an anti-scatter grid of the X-ray image acquisition system in at least one direction to align the anti-scatter grid with the X-ray beam focus position (37), provides an improved anti-scatter grid for X-ray acquisition systems. The invention provides the use of an improved anti-scatter grid (26) for X-ray acquisition systems (20). |
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