INSPECTION DEVICE, INSPECTION RESULTS MANAGEMENT SYSTEM, INSPECTION RESULTS STORAGE METHOD, AND INSPECTION RESULTS MANAGEMENT METHOD

An inspection apparatus includes an image-capturing unit configured to capture an image of an article, an inspection unit configured to inspect the article, a generation-processing unit, and a storage-processing unit. The generation-processing unit generates a data group related to an inspection res...

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Bibliographische Detailangaben
Hauptverfasser:	KAWANISHI, Norio, ABE, Yoichiro
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	An inspection apparatus includes an image-capturing unit configured to capture an image of an article, an inspection unit configured to inspect the article, a generation-processing unit, and a storage-processing unit. The generation-processing unit generates a data group related to an inspection result obtained by the inspection unit, the data group including article information for distinguishing the article, the inspection result obtained by the inspection unit, captured-image information for distinguishing a captured image captured by the image-capturing unit from another captured image, and a hash value of the captured image that are associated with each other. The storage-processing unit stores the data group and the captured image in respective different storage units.