MEASUREMENT PROCESSING DEVICE, MEASUREMENT PROCESSING METHOD, AND PROGRAM

A measurement processing device includes: a storage section; a first obtaining section configured to obtain a first signal which is outputted from a first device and indicates a measurement result of measurement of a measurement target object; a temporary storage section configured to store the firs...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	KUDO, Masaya
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A measurement processing device includes: a storage section; a first obtaining section configured to obtain a first signal which is outputted from a first device and indicates a measurement result of measurement of a measurement target object; a temporary storage section configured to store the first signal obtained by the first obtaining section; a second obtaining section configured to obtain a second signal which is outputted from a second device and indicates (i) a position of the measurement target object or (ii) an amount of change which is in accordance with the position of the measurement target object, the second device being different from the first device; a storage control section configured to cause the storage section to store measurement information in which the second signal which has been obtained is associated with the first signal which has been stored in the temporary storage section; and an output control section configured to output, to a control device, at least one measurement information among the measurement information stored in the storage section.