HOLE LOCATION TARGETS AND MEASUREMENT SYSTEMS, AND METHODS FOR MEASURING A LOCATION OF A HOLE

A hole location target includes a self-centering insert having a centerline and an optical target attached to the self-centering insert at a fixed position relative to the centerline of the self-centering insert. The optical target surface includes a two-dimensional pattern thereon.

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Hauptverfasser:	HULL, Jerald A, FREEMAN, Philip L
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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creator	HULL, Jerald A FREEMAN, Philip L
description	A hole location target includes a self-centering insert having a centerline and an optical target attached to the self-centering insert at a fixed position relative to the centerline of the self-centering insert. The optical target surface includes a two-dimensional pattern thereon.
format	Patent
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language	eng ; fre ; ger
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subjects	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
title	HOLE LOCATION TARGETS AND MEASUREMENT SYSTEMS, AND METHODS FOR MEASURING A LOCATION OF A HOLE
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