HOLE LOCATION TARGETS AND MEASUREMENT SYSTEMS, AND METHODS FOR MEASURING A LOCATION OF A HOLE

HOLE LOCATION TARGETS AND MEASUREMENT SYSTEMS, AND METHODS FOR MEASURING A LOCATION OF A HOLE

A hole location target includes a self-centering insert having a centerline and an optical target attached to the self-centering insert at a fixed position relative to the centerline of the self-centering insert. The optical target surface includes a two-dimensional pattern thereon.

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Bibliographische Detailangaben
Hauptverfasser: HULL, Jerald A, FREEMAN, Philip L
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A hole location target includes a self-centering insert having a centerline and an optical target attached to the self-centering insert at a fixed position relative to the centerline of the self-centering insert. The optical target surface includes a two-dimensional pattern thereon.