QUANTITATIVE MULTILAYER ASSESSMENT METHOD
A method of analyzing layer thickness of a multilayer component (100) is provided. The method includes: creating an opening (120) having a predefined geometry partially into the multilayer component (100) at a selected location on a surface (154) of the multilayer component (100). The multilayer com...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | A method of analyzing layer thickness of a multilayer component (100) is provided. The method includes: creating an opening (120) having a predefined geometry partially into the multilayer component (100) at a selected location on a surface (154) of the multilayer component (100). The multilayer component (100) includes a plurality of material layers including a substrate (104) and a bond coat (110). The opening (120) exposes each of the plurality of material layers including the substrate (104). Contrast of the exposed plurality of material layers can be increased. An image (152) is created of the exposed layers in the opening (120) using a digital microscope (150), and thickness of a bond coat (110), thickness of a depletion layer (118) \ and/or thickness of an oxide layer (116) is calculated from the image (152) and based on the predefined geometry of the opening (120). Repairing the opening (120), allows the multilayer component (100) to be used for an intended purpose after testing, e.g., re-installed and reused in a gas turbine. |
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